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System Test

Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .

See Also: Systems, Equipment, Test Systems, System Integrators


Showing results: 3541 - 3555 of 4427 items found.

  • High-Density PXI Switch Matrix Modules

    Pickering Interfaces Ltd.

    Pickering's range of high-density switch matrix modules is a cost-effective solution for applications that require high-density matrices in the PXI format. The ability to expand to larger matrices is possible by connecting together multiple modules. Reed relay versions use high quality sputtered ruthenium reeds that exhibit excellent contact performance under low and medium level switching conditions, solid-state relay versions available for high speed and long life and electro-mechanical versions for current handling up to 2 Amps. Select models are supported by Pickering's Diagnostic Test Tools, Built-In-Relay-Self-Test (BIRST) and eBIRST Switching System Test Tools, these tools provide a quick and simple way of finding relay failures within LXI, PCI and PXI switch systems.

  • Semiconductor Memory Tester

    T5851 - Advantest Corp.

    Advantest Corporation has introduced the T5851 system, designed to provide a cost-effective test solution for high-performance universal flash storage (UFS) devices and PCIe BGA solid-state drives (SSDs) memory ICs in high demand by makers of low-power, mobile applications such as smart phones, tablets and ultra-portable laptops. The flexible T5851 tester is available in both production and engineering models. This allows the system to be used for reliability and qualification testing as well as test-program development or, when equipped with an automated component handler such as Advantest''''s M6242, high-volume production. As a fully integrated, system-level test solution, the T5851 provides multi-protocol support in one tool while its tester-per-DUT architecture and proprietary hardware accelerator allow it to achieve industry-leading test times.

  • Flying Probe Tester

    FA1817 - HIOKI E.E. Corp

    Flying Probe Tester FA1817, an automatic testing system designed to inspect printed wiring on bare boards. The FA1817’s features and capabilities make it ideal for use in inspecting high-density printed wiring boards. With support for a broad range of test types, from low-resistance measurement to high-insulation-resistance measurement, the system reliably detects the latent defects that trouble end-users.

  • Laser Diode Light Current Voltage (LIV) Test Instruments

    Yelo Ltd.

    The Yelo LIV test instrument allows LIV measurements to be taken from laser devices loaded into a Yelo module. This module can also be used with the Yelo Y1000L Low Power Burn-in system. The LIV test instrument has been designed for easy operation. Once powered on, and with laser supply enabled, the touch screen can be used to initiate, monitor and review measurements of laser devices.

  • Coupler And Decoupler Used With Lightning Impulse Simulation Tester

    Kast Eng Co. LTD.

    All electric equipments & systems is required Impulse Simulation Test to the to be tested under the condition where the power source is applied to the product-under-test.At this test condition, the decoupler is needed to reduce the impulse flowing through the power line while testing. And the coupler which is inserted between tester and product, to simulate the actual condition, so the electric circuit of decoupler is prescribet by IEC rules.

  • Battery Analyzers for Stationary Battery Systems

    Fluke Corporation

    Fluke Battery Analyzers are the ideal test tool for maintaining, troubleshooting and performance testing individual stationary batteries and battery banks used in critical battery back-up applications in data centers, telecom networks, power distribution systems and more. With an intuitive user interface, a compact design, and rugged construction the Fluke Battery Analyzers are designed to provide optimum performance, test results and reliability.

  • High-accuracy Multi-channel Programmable DC Power Supply

    N39400 Series - Next Generation Instrumental (Shanghai) T&C Tech. Co., Ltd.

    N39400 series is a high-accuracy & multi-channel programmable DC power supply with standard 19-inch 2U design, available for cabinet installation. Single N39400 supports Max. 4 channels output, with channels isolated. Both local operation on front panel and remote control on a computer are supported. N39400 can be widely used in lab test, system integration test, production aging line, etc.

  • Digital Earth Resistance Tester, ERT-1502

    Neutronics Manufacturing Co.

    Our Earth Tester is a very successful replacement of the conventional generator type hand tester. This device is most extensively used to test the earthing installation in numerous power based industries, electrical traction systems and telecommunication networks.

  • Fastest In-Circuit Test Platform

    TestStation - Teradyne, Inc.

    Teradyne’s TestStation in-circuit test systems provide electronics manufacturers with reliable high-quality, high-volume testing for the latest printed circuit board assembly (PCBA) technologies that are used in automotive, industrial, computing, consumer, communications, and defense end-products.

  • High Temperature Self-Supporting Furnace Extensometers (1200 C)

    Model 3448 - Jinan Testing Equipment IE Corporation

    Epsilon developed this unique high temperature extensometer for testing metals, ceramics, and composites at the high temperatures produced by furnaces and induction heating systems. A combination of features make these extensometers easier to use and better in performance than other similar high temperature extensometers.The units are held on the specimen by light, flexible ceramic fiber cords. These make the extensometer self-supporting on the specimen. No furnace mounting brackets are required. The side load on the test sample is greatly reduced because of the self-supporting design and light weight of the sensor. Most materials testing furnaces with a side cut-out for an extensometer will readily accept a Model 3448. For induction heating systems, a different ceramic cord placement allows the extensometer to easily pass between the coils.The combination of radiant heat shields and convection cooling fins allow this model to be used at specimen temperatures up to 1200℃ (2200°F) without any cooling. An optional tiny air fan does enhance stability at the highest temperatures and is recommended for the highest accuracy and for tests with small elongations. The fan comes with a magnetic base for support so it can be mounted at any convenient location near the extensometer. Fan cooling is not generally needed for induction heated systems. High purity alumina ceramic rods are used. These are available in lengths as required to fit your furnace. A spare set is included with every extensometer. Specify chisel, vee chisel or conical contact points as desired.Most units operate equally well in tension and compression. Thus tensile, compression and cyclic tests like low cycle fatigue can all be performed with a single unit.For vacuum furnaces, special models are available. Epsilon can also provide a radiant heat transfer cooled version. This requires that the extensometer module be surrounded by a water cooled enclosure with a front slot for the ceramic rods.

  • Elvior TestCast

    TTCN-3 - Verifysoft Technology GmbH

    Elvior TestCast is a TTCN-3 test development and execution platform which includes TTCN-3 editor, TTCN-3 compiler and TTCN-3 executive. TestCast can be used for testing software or hardware components in a wide range of industry sectors. Candidate systems for testing with TestCast can be found from the industry sectors where TTCN-3 is widely used as an accepted generic test language - telecommunication, IOT, transport and automotive, military and defense. TestCast is ideal for incremental project development. It can be used for testing of an individual task or process. One can continue with the integration tests of a subsystem consisting of processes and later to integrate those subsystems and test them together as a whole software subsystem. It is even possible to continue to perform software/hardware integration tests where TestCast can be used to test software embedded in target hardware.

  • RF Bias Burn-In System

    Accel-RF Corporation

    These systems deliver an unbeatable combination of advantages over a wide range of RF frequencies and power levels. The Automated Multi-Channel RF-Biased Burn-In Test System is a turnkey system that incorporates all of the capability needed for accelerated aging and parametric testing of RF semiconductor devices. Its powerful software elegantly supports data acquisition, storage, and presentation. Accel RF’s customers choose system features to meet their technical needs and capital budget. In addition to cost savings, use of Accel-RF’s solutions accelerate product time-to-market, saving many months of product development.

  • Micro-ohmmeters

    MMR-650 - Sonel S.A.

    Designed to measure very low resistances of both resistive and inductive types of objects, including amorphous core transformers. This product is made to be used in power plants, railways and maintenance companies, to measure welded and soldered connections, equipotential bondings, earthing conductors, contacts, bolted connections, windings of motors and power transformers and other resistive and inductive objects. MMR-650 can be also utilized on a production lines (eg. at the final production control stage). An innovative combination of a high-performance measuring device with a modern user interface and advanced data management system. Wireless data transmission, enhanced system of 2D codes and ability to print labels to identify test items, all contribute to bringing new quality of work and allow the user to perform a wide range of measurements.

  • Millimeter Wave Continuously Variable Waveguide Attenuators

    Fairview Microwave Inc.

    Our millimeter wave variable waveguide attenuators allow designers and engineers to test their systems at various signal strengths and attenuation values to determine the optimum signal performance of the system. The key feature of these waveguide attenuators is that the attenuation level is adjusted using a built-in micrometer which enables repeatable and rapid re-setting to different attenuation levels without the need for additional external components. Our waveguide attenuators handle varying attenuation levels from 0 to 30 dB over the specified band allowing the designer to tune the attenuation level needed for the application. These continuously variable waveguide attenuators cover a broad frequency range of 33 to 110 GHz in five bands and also display flat performance across a wide band with low insertion loss.

  • VLF Diagnostics System

    PHG 80 TD - BAUR Prüf- und Messtechnik GmbH

    Cable testing and diagnostics with the BAUR PHG 80 TD. The combination of the PHG 80 programmable test generator with the BAUR dissipation factor measurement system produces the cable testing and diagnostics system PHG TD. It is operated via PC control. Dissipation factor measurement and diagnostic testing sequences can be programmed in the menu, after which the dissipation factor measured values are automatically determined in various voltage steps and a final evaluation is conducted.* Biggest dynamic range of tan delta measured values from 1 to 10-4 with a cable capacitance >10 nF to 20 uF* High resolution +/- 1x10-5 applicable even in new PE/XLPE cables* Insensitive against interferences due to complete mains separation* Lowest time required for assessing a medium-voltage cable (3-phase approx. 1 hour)

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